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| Definition | : | Electronique à Balayage French [Scanning Electron Microscopy] |
| Category | : | Technology » Tech Terms |
| Country/ Region |
: | Worldwide
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Initialism
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Scanning Electron Microscopy (French: Microscopie Electronique à Balayage, MEB) is an electron microscopy technique capable of producing high-resolution images of the surface of a sample by scanning the surface with a focused beam of electrons.
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Milli Eğitim Bakanlığı
[Ministry of National Education]
Departments & Agencies
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Marine Expeditionary Brigade
Security & Defence
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Maneuver Enhancement Brigade
Military
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Modularer ElektroBaukasten
[Modular Electrification Toolkit]
Automotive
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Micro Enterprise Bank
Banking
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Midlands Electricity Board
Companies & Corporations
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Essendon Fields Airport
Airport Codes
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Laurinburg–Maxton Airport
Airport Codes
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The full form of MEB is Electronique à Balayage
Electronique à Balayage | Modularer ElektroBaukasten
Electronique à Balayage | Modularer ElektroBaukasten | Micro Enterprise Bank